The measurement of critical angle of refraction is dependent on having a clean interface between the measurement device and the process itself. Numerous design features are incorporated into the sensing head and mounting adapters to ensure that this interface stays as clean as possible with as little involvement as possible.
The MPR E-Scan™ uses a sapphire prism, which is nearly as hard as diamond, as it's process interface. Using this extremely hard material alone can prevent coatings in many applications. In applications where cleaning is necessary, the sapphire's durability ensures that years of cleaning can be endured.
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